Improved Linear-Light-Source Material Reflectance Scanning (bibtex)
by Jan Meseth, Shawn Hempel, Andrea Weidlich, Graham Fyffe, Craig Miller, Paul Carroll, Paul Debevec, Lynn Fyffe
Abstract:
We improve the resolution, accuracy, and efficiency of Linear Light Source (LLS) Reflectometry with several acquisition setup and data processing improvements, allowing spatiallyvarying reflectance parameters of complex materials to be recorded with unprecedented accuracy and efficiency.
Reference:
Improved Linear-Light-Source Material Reflectance Scanning (Jan Meseth, Shawn Hempel, Andrea Weidlich, Graham Fyffe, Craig Miller, Paul Carroll, Paul Debevec, Lynn Fyffe), In ACM SIGGRAPH 2012 Talks, 2012.
Bibtex Entry:
@inproceedings{meseth_improved_2012,
	title = {Improved {Linear}-{Light}-{Source} {Material} {Reflectance} {Scanning}},
	url = {http://ict.usc.edu/pubs/Improved%20Linear-Light-Source%20Material%20Reflectance%20Scanning.pdf},
	abstract = {We improve the resolution, accuracy, and efficiency of Linear Light Source (LLS) Reflectometry with several acquisition setup and data processing improvements, allowing spatiallyvarying reflectance parameters of complex materials to be recorded with unprecedented accuracy and efficiency.},
	booktitle = {{ACM} {SIGGRAPH} 2012 {Talks}},
	author = {Meseth, Jan and Hempel, Shawn and Weidlich, Andrea and Fyffe, Graham and Miller, Craig and Carroll, Paul and Debevec, Paul and Fyffe, Lynn},
	month = aug,
	year = {2012},
	keywords = {Graphics}
}
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